Scanning Electron Microscopy (SEM)
SEM uses a focused electron beam to scan a surface. A wide variety of specimens can be analysed onto a 50 mm stub. However, nonconductive specimens must be coated with carbon or metal to prevent charging in the electron beam.
Sample preparation for SEM can include cutting samples, extraction, fracturing and freeze fracturing surfaces.
The scanning electron microscope can be used with attached energy dispersive X-ray spectroscopy (EDX) to obtain qualitative X-ray spectra and identification of sample components.
Rubber Consultants use SEM to investigate a broad spectrum of materials including metals, metal wires, metal coatings, plastics, elastomers, contaminants, rubber composites, powders, crumb, and bonding agents.
The SEM and its x-ray system (SEM EDX) are frequently used with other analytical techniques available on site for industrial trouble shooting and reverse engineering.
Please contact us to discuss your requirements.
Applications
- Micrographing surfaces or pre-prepared cross-sections of material
- X-ray spectra to determine elements present within a sample
- X-ray mapping to determine elements present within a sample and their location
