Microscopy
Optical Microscopy (OM)
Optical Microscopy utilises visible light to observe and capture high-resolution images of samples, providing valuable insights into their structure and morphology at the microscale.
Scanning Electron Microscopy (SEM)
Scanning Electron Microscopy employs a focused electron beam to generate high-resolution images of samples, allowing for detailed examination of surface topography and composition at the nanoscale.
Transmission Electron Microscopy (TEM)
Transmission electron microscopy utilizes a focused beam of electrons to obtain high-resolution images of ultra-thin samples, revealing intricate details of their internal structure and atomic arrangement.
Atomic Force Microscopy (AFM)
Atomic Force Microscopy employs a sharp probe to scan and detect surface topography at the nanoscale, enabling high-resolution imaging and precise measurement of various physical properties.
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