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40 Years: In 2024 Rubber Consultants Celebrate 40 Years


Optical Microscopy (OM)

Optical Microscopy utilises visible light to observe and capture high-resolution images of samples, providing valuable insights into their structure and morphology at the microscale.

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Scanning Electron Microscopy (SEM) 

Scanning Electron Microscopy employs a focused electron beam to generate high-resolution images of samples, allowing for detailed examination of surface topography and composition at the nanoscale.

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Transmission Electron Microscopy (TEM)

Transmission electron microscopy utilizes a focused beam of electrons to obtain high-resolution images of ultra-thin samples, revealing intricate details of their internal structure and atomic arrangement.

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Atomic Force Microscopy (AFM)

Atomic Force Microscopy employs a sharp probe to scan and detect surface topography at the nanoscale, enabling high-resolution imaging and precise measurement of various physical properties.

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